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PDF-SCT week Summary of ASIC defects in Japan Dead ST PDF document

90 brPage 2br ID 776 Dead M00 Z40800W04192 Before trim After trim warm cold 15 ASICs 17 After trim Noise Threshold Curve 0fC brPage 3br ID 1358 Stuck cell E05 Z41089W02219

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SCT week Summary of ASIC defects in Japan Dead ST: Transcript

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