PDF-SCT week Summary of ASIC defects in Japan Dead ST

Author : trish-goza | Published Date : 2015-05-17

90 brPage 2br ID 776 Dead M00 Z40800W04192 Before trim After trim warm cold 15 ASICs 17 After trim Noise Threshold Curve 0fC brPage 3br ID 1358 Stuck cell E05 Z41089W02219

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SCT week Summary of ASIC defects in Japan Dead ST: Transcript

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