PDF-Electron trapping storing and emission in nanocrystalline Si dots by capacitancevoltage and conductancevoltage measurements Shaoyun Huang Souri Banerjee Raymond T
Tung and Shunri Oda a Research Center for Quantum Effect Electronics Tokyo Institute of Technology 2121 Ookayama Meguroku Tokyo 1528552 Japan Received 24 May 2002
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