PPT-Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process

Modeling Part 1 of 3 Souvik Mahapatra Department of Electrical Engineering Indian Institute of Technology Bombay Mumbai India Email souvikeeiitbacin mahapatrasouvikgmailcom

stress time recovery degradation time stress degradation recovery dependence nbti generation measurement traps interface irps

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