PPT-Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process
Author : likets | Published Date : 2020-06-17
Modeling Part 1 of 3 Souvik Mahapatra Department of Electrical Engineering Indian Institute of Technology Bombay Mumbai India Email souvikeeiitbacin mahapatrasouvikgmailcom
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process: Transcript
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