PDF-Abruptness of SiH Si interface revealed by carrier lifetime measurements Stefaan De Wolf
Author : karlyn-bohler | Published Date : 2015-03-16
In this letter the authors con64257rm that this is strongly determined by the abruptness of the interface For completely amorphous 64257lms the passivation quality
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Abruptness of SiH Si interface revealed by carrier lifetime measurements Stefaan De Wolf: Transcript
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