PDF-Specific Contact Resistance Measureme nts of MetalSemiconductor Junctions BSTRACT NTROD UCTION ESCRIPTIO N T E MEASUREMENT TECHNIQ UES A
Tran sm ission Lin Mod l RR WL U W L RR 2006 International Conference on Microelectronic Test Structures 1424401674062000 575132006 IEEE 13 brPage 2br RR L W L RR
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