PDF-Progress in AberrationCorrected HighResolution Transmission Electron Microscopy Using

Author : danika-pritchard | Published Date : 2015-01-24

The corrected instrument a Philips CM200 FEG ST has an information limit of better than 013 nm and the spherical aberration can be varied within wide limits even

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Progress in AberrationCorrected HighResolution Transmission Electron Microscopy Using: Transcript

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